SPIE 2013
SPIE, Munich, Germany; Proc. SPIE 8797, Advanced Microscopy Techniques III, 879709 (17 June 2013);
Title: Improving TCSPC data acquisition from CMOS SPAD arrays
Author: N. Krstajić, S. Poland; D. Tyndall, R. Walker, S. Coelho, D.-U. Li, J. Richardson, S. Ameer-Beg, and R. Henderson
doi:  10.1117/12.2032807